Multi-wavelength imaging system

Details Multi-wavelength imaging system Multi-wavelength imaging system

2005-05-13

2008-09-02

Lauchman, L. G. (Department: 2877)

Optics: measuring and testing

By polarized light examination

C356S367000

Reexamination Certificate

active

07420675

ABSTRACT:
The present invention relates to a multi-energy system that generates and/or forms images of targets/structures by applying Mueller matrix imaging principles and/or Stokes polarimetric parameter imaging principles to data obtained by the multi-energy system. In one embodiment, the present invention utilizes at least one energy or light source to generate two or more Mueller matrix and/or Stokes polarization parameters images of a target/structure, and evaluates the Mueller matrix/Stokes polarization parameters multi-spectral difference(s) between the two or more images of the target/structure. As a result, high contrast, high specificity images can be obtained. Additional information can be obtained by and/or from the present invention through the application of image, Mueller matrix decomposition, and/or image reconstruction techniques that operate directly on the Mueller matrix and/or Stokes polarization parameters.

REFERENCES:
patent: 5129724 (1992-07-01), Brophy et al.
patent: 5216433 (1993-06-01), Kurtz
patent: 5247176 (1993-09-01), Goldstein
patent: 5521705 (1996-05-01), Oldenbourg et al.
patent: 5606546 (1997-02-01), Best et al.
patent: 5788632 (1998-08-01), Pezzaniti et al.
patent: 5850284 (1998-12-01), Schoeffler et al.
patent: 6204924 (2001-03-01), Cyr
patent: 6207924 (2001-03-01), Cyr
patent: 6316773 (2001-11-01), Giakos
patent: 6384916 (2002-05-01), Furtak
patent: 6567678 (2003-05-01), Oosta
patent: 6618145 (2003-09-01), Goldstein
patent: 6636582 (2003-10-01), Rader
patent: 6643021 (2003-11-01), Kawamura
patent: 6683934 (2004-01-01), Zhao et al.
patent: 6762829 (2004-07-01), Babin et al.
patent: 6927888 (2005-08-01), Garcia et al.
patent: 7002685 (2006-02-01), Wang
patent: 7022685 (2006-02-01), Wang
patent: 7061614 (2006-06-01), Wang et al.
patent: 2004/0012853 (2004-01-01), Garcia et al.
patent: WO 02/19381 (2002-03-01), None
Smith, Matthew H., Optimization of a dual-rotating-retarder Mueller matrix polarimeter, Applied Optics, May 1, 2002, pp. 2488-2493, vol. 41, No. 13.
Demos, S.G., et al., Deep Subsurface Imaging in Tissues Using Spectral & Polarization Filtering, Optic Express, Jul. 2000, pp. 23-28, vol. 7, No. 1.
Chenault, D.G., et al., Mueller Matrix Algorithms, SPIE, 1992, pp. 231-246, vol. 1746.
A Azzam, R.M., Photopolarimetric Measurement of the Mueller Matrix by Fourier Analysis of a Single Detected Signal, Optics Letters, 1978, pp. 148-150, vol. 2, No. 6.
Goldstein, D.H., et al., Near Infrared Imaging Polarimetry, SPIE, 2002, vol. 4481, p. 100.
Chenault, D.B., et al., Polarization Imaging through Scattering Media, SPIE, 2000, vol. 4133, p. 124.
Lu, S., et al., Interpretation of Mueller Matrices Based on Polar Decomposition, J. of Opt. Soc. Am., May 1996, vol. 13, No. 5 pp. 1106-1113.

Affiliated with

Also associated with

Rating

Multi-wavelength imaging system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Multi-wavelength imaging system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multi-wavelength imaging system will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3986408