Image analysis – Applications
Reexamination Certificate
2006-06-06
2006-06-06
Couso, Yon J. (Department: 2625)
Image analysis
Applications
C382S108000
Reexamination Certificate
active
07058197
ABSTRACT:
An computer implemented apparatus and method are disclosed for defining areas of a field in which a crop or other vegetation is grown based on their selective ability to grow such vegetation through a growing season, or some shorter preselected time period. The method includes making a number of temporally separated measurements through air borne imaging of a field, registering the data to the geography of the field and each other, normalizing the data including converting the data to a vegetative index indicative to the presence of vegetation in the field, comparing the data to identify clusters of like value, and classifying the clusters and images to learn how the different field areas responded in growing vegetation through the season. With this method, the field may be segregated into a number of like areas called crop response zones which exhibit similar vegetative growth characteristics as an aid to a grower in his decision making regarding how to maximize yield in his field.
REFERENCES:
patent: 2916212 (1959-12-01), Mita
patent: 2980330 (1961-04-01), Ablow et al.
patent: 3027083 (1962-03-01), Heigl et al.
patent: 3136887 (1964-06-01), Heigl et al.
patent: 3978324 (1976-08-01), Rayner
patent: 4015366 (1977-04-01), Hall, III
patent: 4227211 (1980-10-01), Disbrow
patent: 4276561 (1981-06-01), Friedman
patent: 4315282 (1982-02-01), Schumacher
patent: 4642766 (1987-02-01), Funk et al.
patent: 4851999 (1989-07-01), Moriyama
patent: 4908763 (1990-03-01), Sundberg
patent: 4918602 (1990-04-01), Bone et al.
patent: 5166789 (1992-11-01), Myrick
patent: 5233513 (1993-08-01), Doyle
patent: 5299115 (1994-03-01), Fields et al.
patent: 5323317 (1994-06-01), Hampton et al.
patent: 5406477 (1995-04-01), Harhen
patent: 5414847 (1995-05-01), Tsukakoshi
patent: 5444819 (1995-08-01), Negishi
patent: 5459656 (1995-10-01), Fields et al.
patent: 5521813 (1996-05-01), Fox et al.
patent: 5521814 (1996-05-01), Teran et al.
patent: 5627973 (1997-05-01), Armstrong et al.
patent: 5630127 (1997-05-01), Moore et al.
patent: 5631970 (1997-05-01), Hsu
patent: 5646846 (1997-07-01), Bruce et al.
patent: 5659623 (1997-08-01), Conrad
patent: 5668719 (1997-09-01), Bobrov et al.
patent: 5689418 (1997-11-01), Monson
patent: 5712985 (1998-01-01), Lee et al.
patent: 5715185 (1998-02-01), Carter
patent: 5719949 (1998-02-01), Koeln et al.
patent: 5727161 (1998-03-01), Purcell, Jr.
patent: 5734837 (1998-03-01), Flores et al.
patent: 5745878 (1998-04-01), Hashimoto et al.
patent: 5764819 (1998-06-01), Orr et al.
patent: 5765137 (1998-06-01), Lee
patent: 5768128 (1998-06-01), Thompson et al.
patent: 5790428 (1998-08-01), Easton et al.
patent: 5812988 (1998-09-01), Sandretto
patent: 5822736 (1998-10-01), Hartman et al.
patent: 5832456 (1998-11-01), Fox et al.
patent: 5862512 (1999-01-01), Voorhees et al.
patent: 5867820 (1999-02-01), Cureton et al.
patent: 5873049 (1999-02-01), Bielak et al.
patent: 5878356 (1999-03-01), Garrot et al.
patent: 5884224 (1999-03-01), McNabb et al.
patent: 5886662 (1999-03-01), Johnson
patent: 5897619 (1999-04-01), Hargrove, Jr. et al.
patent: 5901237 (1999-05-01), Conrad
patent: 6366681 (2002-04-01), Hutchins
patent: PCT/US00/41510 (1999-11-01), None
patent: WO00/08590 (2000-02-01), None
Using Advanced Very High Resolution Radiometer Imagery to Map Rice Cropping Areas in Central Texas, Eleni J. Paliouras and William J. Emery, 1999 IEEE, pp. 744-746.
A Model-Based System For Crop Classification From Radar Imagery, J.A. Conway, L.M.J. Brown, N.J. Veck and R.A. Cordey, GEC Journal of Research, vol. 9, No. 1, 1991, pp. 46-54.
Pattern Classification and Scene Analysis, R.O. Duda and P.E. Hart, 1973, pp. 24-31.
McGuire John Dennis
Pearson Randall Scott
Board of Trustees of the University of Illinois
Couso Yon J.
Thompson & Coburn LLP
LandOfFree
Multi-variable model for identifying crop response zones in... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Multi-variable model for identifying crop response zones in..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multi-variable model for identifying crop response zones in... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3703032