Multi tip clearance measurement system and method of operation

Details Multi tip clearance measurement system and method of operation Multi tip clearance measurement system and method of operation

2007-05-08

2007-05-08

Hirshfeld, Andrew H. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S661000, C324S690000

Reexamination Certificate

active

11393584

ABSTRACT:
A multi tip clearance measurement system is provided. The clearance measurement system includes a sensor disposed on a first object, wherein the sensor comprises a plurality of probe tips configured to generate signals representative of a sensed parameter corresponding to a second object and a processing unit configured to evaluate the signals from subsets of the sensed parameters from the probe tips to detect an outlier probe tip and to adjust a gain, or an offset of the respective outlier probe tip for estimating the clearance between the first and second objects based upon the signals.

REFERENCES:
patent: 4063167 (1977-12-01), Duly
patent: 4806848 (1989-02-01), Demers
patent: 4847556 (1989-07-01), Langley
patent: 6556957 (2003-04-01), Daumer
patent: 6692222 (2004-02-01), Prinz et al.
patent: 0879394 (2004-02-01), None

Affiliated with

Also associated with

Rating

Multi tip clearance measurement system and method of operation does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Multi tip clearance measurement system and method of operation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multi tip clearance measurement system and method of operation will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3734578