Multi-step method of nondestructively measuring a region...

Details Multi-step method of nondestructively measuring a region... Multi-step method of nondestructively measuring a region...

2007-05-08

2009-11-10

Thomas, Courtney (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Fluorescence

C378S050000

Reexamination Certificate

active

07616734

ABSTRACT:
A method for nondestructively obtaining measurement information of a region within one or more ultra-hard polycrystalline constructions comprises conducing a first measurement using x-ray fluorescence by directing x-rays onto a surface of the diamond body, receiving x-ray fluorescence from the diamond body, and deriving measurement information regarding the region therefrom. A second method can be used on the same or other ultra-hard polycrystalline constructions to obtain measurement information regarding the region in a manner that is relatively more time efficient than the first method to facilitate use of the measurement method on a large number of constructions. The second measurement can be selected from the group including beta backscatter, x-ray radioscopy, eddy current, magnetic induction, and microresistance. In an example embodiment, the method is used to determine the thickness of a region within the diamond body that comprises less catalyst material than another region within the body.

REFERENCES:
patent: 5603414 (1997-02-01), Rooney et al.
patent: 5835205 (1998-11-01), Hunter et al.
patent: 6544308 (2003-04-01), Griffin et al.
patent: 7196782 (2007-03-01), Fielden et al.

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