Multi-step analog/digital converter and on-line calibration...

Details Multi-step analog/digital converter and on-line calibration... Multi-step analog/digital converter and on-line calibration...

2006-11-28

2006-11-28

JeanPierre, Peguy (Department: 2819)

Coded data generation or conversion

Converter calibration or testing

C341S161000

Reexamination Certificate

active

07142138

ABSTRACT:
The present invention discloses an on-line calibration method, which utilizes two calibration algorithms running in the background without interrupting the normal operation of the analog signal process. The method includes performing a residue amplifier gain error calibration and performing a DAC non-linearity calibration. The residue amplifier gain error calibration can reduce the gain error of the residue amplifier for a missing code or a missing decision level phenomenon. The DAC non-linearity calibration can relax the matching requirement of passive components in current semiconductor processes. The present invention discloses a two-step ADC (Analog-to-Digital Converter), which includes a first signal processing unit, a second signal processing unit, a programmable gain control unit and a programmable reference voltage generator, performing the on-line calibration method.

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patent: 6563445 (2003-05-01), Sabouri
patent: 6720895 (2004-04-01), Poulton et al.
patent: 6784814 (2004-08-01), Nair et al.

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