Multi-stage planar stochastic mensuration

Details Multi-stage planar stochastic mensuration Multi-stage planar stochastic mensuration

2006-01-03

2006-01-03

Nghiem, Michael (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Statistical measurement

Reexamination Certificate

active

06983222

ABSTRACT:
The method includes reading a data set including a sparse number of data points and applying multiple tests wherein the results are evaluated by a decision module to determine whether to classify the data as random or nonrandom. In one preferred embodiment, if any one test determines the data is nonrandom, then the data is labeled nonrandom. The data is labeled and stored prior to beginning the method once again for the next set of data.

REFERENCES:
patent: 5144595 (1992-09-01), Graham et al.
patent: 5675553 (1997-10-01), O'Brien, Jr. et al.
patent: 5703906 (1997-12-01), O'Brien, Jr. et al.
patent: 5757675 (1998-05-01), O'Brien, Jr.
patent: 5781460 (1998-07-01), Nguyen et al.
patent: 5963591 (1999-10-01), O'Brien, Jr. et al.
patent: 5996414 (1999-12-01), Mercado
patent: 6397234 (2002-05-01), O'Brien, Jr. et al.
patent: 6466516 (2002-10-01), O'Brien et al.
Hoel et al., Introduction to Theory of Probability, Houghton-Mifflin, Boston, MA 1971, pp 1-5.
G.H. Moore & W.A. Wallis, 1943 “Time Series Significance Tests Based on Signs of Difference”, Journal of the American Statistical Assoc., vol. 39 pp. 153-164.

Affiliated with

Also associated with

Rating

Multi-stage planar stochastic mensuration does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Multi-stage planar stochastic mensuration, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multi-stage planar stochastic mensuration will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3602751