Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-05-10
2005-05-10
Zarneke, David (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010, C324S1540PB
Reexamination Certificate
active
06891384
ABSTRACT:
An interface structure includes first and second portions. The first portion has physical dimensions that are compatible with the docking area of an associated device tester, and includes a first socket configured to receive a first BGA package. The second portion, which is adjacent to and contiguous with the first portion, extends laterally beyond the docking area of the device tester to provide additional testing area that may include one or more additional sockets. In one embodiment, the second portion includes a second socket configured to receive a second BGA package, wherein the second size and configuration of second BGA package are different from the size and configuration of the first BGA package.
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U.S. Appl. No. 09/849,815, Mardi et al.
Juane Joseph Macabante
Mardi Mohsen Hossein
Liu Justin
Paradice III William L.
Xilinx , Inc.
Young Edel M.
Zarneke David
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