Multi-sample particle analysis apparatus and method

Details Multi-sample particle analysis apparatus and method Multi-sample particle analysis apparatus and method

1982-09-27

1984-09-11

Tokar, Michael J.

Electricity: measuring and testing

Determining nonelectric properties by measuring electric...

324 714, 422 64, G01N 2700

Patent

active

044712979

ABSTRACT:
A suction chamber and at least one sample chamber are located in relatively shiftable operating adjacency. The suction chamber may have a plurality of orifices and the sample chamber a single port for selective registration with the orifices. On the other hand, the suction chamber may have a port or an orifice, and a plurality of sample chambers may have either respective ports or orifices, and the chambers mounted for relative shifting for effecting selective port/orifice registration. A sample depletion detector may be provided in association with the sample chamber. The sample chamber may have a minimum volume residual sample well for maintaining a filled system with the suction chamber to facilitate recurrent sample analyzing function.

REFERENCES:
patent: 3124172 (1964-03-01), Paxson, Jr.
patent: 3266526 (1966-08-01), Berg
patent: 3554037 (1971-01-01), Berg
patent: 3626166 (1971-12-01), Berg
patent: 3648160 (1972-03-01), Beaver
patent: 3763429 (1973-10-01), Hoskins
patent: 3920961 (1975-11-01), Berg
patent: 4296373 (1981-10-01), Angel

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