Multi-processor automatic test system

Excavating

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

364580, 364900, G01R 3128, G06F 1100

Patent

active

043970214

ABSTRACT:
A test system utilizing a plurality of programmable test instruments each capable of executing portions of a test program with the test program being written in a compiler language such as ATLAS, for example, is disclosed. Programs specifying the tests to be performed are written in a compiler language such as ATLAS and transferred to a central control processor utilizing standard peripheral equipment. The central control processor communicates with a plurality of test instruments utilizing a series of data busses. In executing the test program, the control processor first segments the program into a series of individual tests to be performed. The test instruments are interrogated to determine which of the test instruments is currently capable of executing a specific sequence of the test program. Once an instrument has been identified which can execute the program segment, the control process transfers that segment to the instrument capable of executing the test. After a test has been executed, the programmable test instrument executing the test transfers the result of the test back to the central control processor for analysis. In addition to performing the basic test, each of the instruments also has access to the switching matrix so that the required interconnects between the system being tested and the test instruments can be made under the control of the test instrument itself. Functionally, each of the test instruments accepts segments of the overall test program in a compiler language and performs all the functions necessary to execute that segment of the program and transfer the test results to the central processor. The function of the central processor is to control the system, allocate portions of the program to each of the test instruments and analyze the final test result. Alternate embodiments provide means permitting any one of the programmable test instruments to assume control of the entire system.

REFERENCES:
patent: 3694632 (1972-09-01), Bloomer
patent: 4125763 (1978-11-01), Drabing et al.
patent: 4287594 (1981-09-01), Shirasaka
patent: 4300207 (1981-11-01), Eivers et al.
patent: 4313200 (1982-01-01), Nishiura
patent: 4339819 (1982-07-01), Jacobson
patent: 4348759 (1982-09-01), Schnurmann

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Multi-processor automatic test system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Multi-processor automatic test system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multi-processor automatic test system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-487600

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.