Multi-probe flux leakage testing apparatus using skewed probes

Details Multi-probe flux leakage testing apparatus using skewed probes Multi-probe flux leakage testing apparatus using skewed probes

1974-08-13

1976-02-24

Corcoran, Robert J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Frequency of cyclic current or voltage

G01R 3312

Patent

active

039406903

ABSTRACT:
In apparatus in which an object moves longitudinally and rotationally with respect to a multi-probe assembly, each probe including a channel-shaped core of magnetic material having spaced sides which are long compared to the thickness thereof and a coil encircling the core, and bipolar signals are developed whose positive and negative excursions correspond to the largest flaw signal of each polarity simultaneously occurring in the probes, the probes of the assembly are arranged in succession along the longitudinal path of travel of the object and skewed with respect to the longitudinal path of travel with an end of one probe adjacent the end of the next probe to yield flaw indications for longitudinal defects which are largely dependent on the depth of the flaw and independent of its length. Accordingly such indications are approximately the same as for short defects of the same depth, thereby yielding indications more nearly corresponding to the severity of the defects. Two or more probe assemblies with the same skew direction may be employed to increase the speed of inspection. If helical flaws of opposite pitch can be present, two probe assemblies of opposite skew directions can be employed.

REFERENCES:
patent: 2036857 (1936-04-01), Drake
patent: 3504276 (1970-03-01), Proctor et al.
patent: 3854085 (1974-12-01), Mansson et al.

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