Multi-power ring chip scale package for system level...

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With contact or lead

Reexamination Certificate

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Details

C257S784000

Reexamination Certificate

active

07129574

ABSTRACT:
A scalable multi-power integrated circuit package for integrated circuits having spaced apart first, second and third pluralities of respective spaced apart chip power bonding pads connected to-corresponding first, second, and third chip power supply nets, the chip power bonding pads disposed adjacent to a chip periphery defining the chip area, the scalable multi-power integrated circuit package comprising: a central chip mounting area for mounting one of said integrated circuits, said chip mounting area defining a chip mounting area periphery surrounding said chip mounting area; spaced apart first, second and third package power supply continuous conductive traces, each trace disposed adjacent to the chip area mounting periphery; corresponding first, second and third pluralities of spaced apart package bonding areas defined along each respective one of said first, second and third package power supply continuous conductive traces, each respective one of said package bonding areas disposed in bondable alignment with a corresponding one of said chip power bonding pads along said chip periphery such that a permanent conductive bond can be made between said package bonding area and said chip bonding pad. Alternatives include a chip scale package outline, in which one of the chip power supply nets is a common ground return for the other two power supply nets.

REFERENCES:
patent: 6137168 (2000-10-01), Kirkman
patent: 6667546 (2003-12-01), Huang et al.
patent: 6689636 (2004-02-01), Liao et al.
patent: 6770963 (2004-08-01), Wu
patent: 6777802 (2004-08-01), Mora et al.
patent: 6790760 (2004-09-01), Cohn et al.
patent: 6812580 (2004-11-01), Wenzel et al.
patent: 6819565 (2004-11-01), Kao et al.

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