Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2006-09-26
2006-09-26
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
C702S183000, C702S188000, C702S196000
Reexamination Certificate
active
07113891
ABSTRACT:
A system and method for calibrating a multi-port S-parameter measurement device reduces the number of full calibrations necessary to characterize the multi-port S-parameter measurement device by utilizing a reciprocal network concept. The multi-port S-parameter measurement device includes a network analyzer having network ports connected to respective sets of switch ports on a switch. Full calibrations are performed on selected port pairs of the switch to determine the calibration arrays for each of the port pairs. Each port pair includes one switch port from two different sets of switch ports. A switch error having three switch error terms attributable to a reciprocal network introduced by an unselected one of the switch ports not included within any of the one or more port pairs is determined, and the switch error is de-embedded from the calibration arrays to construct a complete set of calibration arrays for all of the measurement paths in the multi-port S-parameter measurement device.
REFERENCES:
patent: 5578932 (1996-11-01), Adamian
patent: 5793213 (1998-08-01), Bockelman et al.
patent: 6147501 (2000-11-01), Chodora
patent: 6188968 (2001-02-01), Blackham
patent: 6300775 (2001-10-01), Peach et al.
patent: 6826506 (2004-11-01), Adamian et al.
patent: WO 00/46605 (2000-07-01), None
Ferrerro, Andrea and Kerwin, Kevin J.; “A New Implementation of a Multiport Automatic Network Analyzer”; IEEE Transactions On Microwave Theory and Techniques, vol. 40, No. 11, Nov. 1992, pp. 2078-2085.
Agilent Technologie,s Inc.
Hoff Marc S.
Suarez Felix
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