Multi-point probe assembly for testing electronic device

Details Multi-point probe assembly for testing electronic device Multi-point probe assembly for testing electronic device

1990-02-20

1992-01-28

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, G01R 106

Patent

active

050846728

ABSTRACT:
A plurality of probe wires are held by a probe supporter having a substantially rectangular cross-section. First, second and third side walls of the supporter, support the probe wires in a manner wherein they are arranged at predetermined intervals in an essentially parallel relationship with each other. The probe wires respectively extend from the first side wall to the second side wall by way of the third side wall. When testing an electronic-device, the third side wall faces a main surface of the device. The third side wall has a groove extending in a direction parallel with the main surface of at least one of the first and second sides wall. Each of the probe wires crosses the groove in a direction perpendicular to the direction along which the groove extends. The portions of the wires which cross the groove are pressed against the tested terminals.

REFERENCES:
patent: 3599093 (1971-08-01), Oates
patent: 3849728 (1974-11-01), Evans

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