Multi-point probe assembly for testing electronic device

Details Multi-point probe assembly for testing electronic device Multi-point probe assembly for testing electronic device

1993-11-17

1994-10-11

Nguyen, Vinh

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, G01R 106, G01R 3102

Patent

active

053550803

ABSTRACT:
Probe pins are mounted on a housing in a manner which deflects the same and induces a preload therein. Upon the pins being brought into contact with a surface, the preload immediately increases the amount of contact pressure which is developed for a given amount of overdrive. In one embodiment the probe pin has both ends secured to the housing. A V-shaped portion is formed in the pin and used as the contact point. The manner in which the probe is secured, bends a portion of the pin proximate the contact point and produces a preload. As the other end is also secured, the preloading is augmented and contact point is prevented from undergoing lateral movement away from the housing on which it is secured.

REFERENCES:
patent: 3613001 (1971-10-01), Hostetter
patent: 4001685 (1977-01-01), Roch
patent: 4035723 (1977-07-01), Kvaternik
patent: 4599559 (1986-07-01), Evans
patent: 4812745 (1989-03-01), Kern
patent: 4965865 (1990-10-01), Trenary
patent: 5049813 (1991-09-01), Van Loan et al.

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