Multi-point measuring method and surveying device

Details Multi-point measuring method and surveying device Multi-point measuring method and surveying device

2008-04-18

2010-06-01

Guadalupe-McCall, Yaritza (Department: 2841)

Geometrical instruments

Straight-line light ray type

Combined

C033S286000, C033S290000

Reexamination Certificate

active

07726033

ABSTRACT:
There are provided a telescope unit (5) having a first image pickup unit for acquiring a wide-angle image and a second image pickup unit for acquiring a telescopic image with higher magnification than the wide-angle image, a distance measuring unit for performing distance measurement by projecting a distance measuring light and by receiving a light reflected from an object to be measured, an angle measuring unit for detecting a horizontal angle and a vertical angle of the telescope unit, a drive unit for rotating and driving the telescope unit in a horizontal direction and in a vertical direction, and a control device for controlling image pickup of the first image pickup unit and the second image pickup unit and for controlling the drive unit based on the results of detection from the angle measuring unit, wherein the control device synthesizes a panoramic image by connecting the wide-angle image obtained by the first image pickup unit, sets up a scheduled measuring point by edge processing of the wide-angle image, and extracts the measuring point corresponding to the scheduled measuring points in the telescopic image by scanning the scheduled measuring point and acquiring the telescopic image by the second image pickup unit with respect to scheduled measuring points, and distance measurement is performed on the measuring point.

REFERENCES:
patent: 6473166 (2002-10-01), Ohishi et al.
patent: 6859269 (2005-02-01), Ohtomo et al.
patent: 7196302 (2007-03-01), Ohtomo et al.
patent: 7319511 (2008-01-01), Murai et al.
patent: 7345748 (2008-03-01), Sugiura et al.
patent: 7552025 (2009-06-01), Ohtomo et al.
patent: 2005/0195384 (2005-09-01), Ohtomo et al.
patent: 2006/0017938 (2006-01-01), Ohtomo et al.
patent: 2007/0107240 (2007-05-01), Piekutowski
patent: 2008/0075326 (2008-03-01), Otani et al.
patent: 2009/0235543 (2009-09-01), Hayashi et al.
patent: 10-019562 (1998-01-01), None
patent: 2000-509150 (2000-07-01), None
patent: 2002-202126 (2002-07-01), None
patent: 2003-279351 (2003-10-01), None
patent: 2004-163292 (2004-06-01), None
patent: 2004-333211 (2004-11-01), None
patent: 2005-249715 (2005-09-01), None
patent: 2008-082707 (2008-04-01), None
patent: 97/40342 (1997-10-01), None
The International Search Report dated Jul. 1, 2008.

Affiliated with

Also associated with

Rating

Multi-point measuring method and surveying device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Multi-point measuring method and surveying device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multi-point measuring method and surveying device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4217524