Multi-level memory cell sensing

Static information storage and retrieval – Floating gate – Multiple values

Reexamination Certificate

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C365S185130, C365S185210, C365S189090

Reexamination Certificate

active

07623373

ABSTRACT:
The delay arising from wordline capacitance in multi-level memories may be reduced by adding switched transistors along the wordline path. Also, the wordline may be pre-charged to a high level and then the first wordline voltage level for reading may be a center level. The switched transistors may be p-devices whose n-wells are biased by a stable DC voltage. Nodes along the wordline may float when not accessed. Finally, a distributed voltage generator may be used.

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Tedrow et al., “Multi-Level Memory Cell Sensing”, U.S. Appl. No. 11/320,529, filed Dec. 28, 2005.

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