Multi-layered measurement model for data collection and...

Electrical computers and digital processing systems: multicomput – Computer network managing – Computer network monitoring

Reexamination Certificate

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C709S223000, C709S225000, C709S219000, C709S227000, C709S217000, C709S226000, C709S235000, C370S400000, C370S392000, C370S338000

Reexamination Certificate

active

07617315

ABSTRACT:
A method and system are described for collecting information from a device in a network at a collection interval. According to an exemplary embodiment, a method for collecting the information includes determining data needed from the device at the collection interval to evaluate the information. A measurement request is defined for collecting the data from the device at the collection interval. The measurement request is merged with other measurement requests for collecting the data from the device at the collection interval into a single merged measurement request at the collection interval. The measurement request is also merged with other measurement requests for collecting the data from the device at different collection intervals having a common integral divisor into a single merged measurement request at a highest of the different collection intervals.

REFERENCES:
patent: 6609083 (2003-08-01), Enck et al.

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