Multi-layer wirings on a semiconductor device and fabrication me

Stock material or miscellaneous articles – Composite – Of bituminous or tarry residue

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

357 67, 357 68, 357 51, 428209, H01L 2348, H01L 2946, H01L 2954, H01L 2962

Patent

active

050722824

ABSTRACT:
A first layer-wiring formed of a material soluble in a solution containing hydrofluoric acid (HF) is protected in an insulating layer. A second layer-wiring insulatingly overlying the first layer is connected with the first layer-wiring via a third layer-wiring which is resistant to a solution containing HF. When contact holes are opened through the insulating layer so as to lead out the first layer-wiring and/or a part of the semiconductor substrate, the first layer-wiring is not exposed to HF containing solution for cleaning the exposed materials in the opened holes. Accordingly, a material having small electrical conductivity but soluble by the HF can be employed for the layer-wiring allowing a high density integration as well good electrical contact with the Si substrate and with other multi-layer wirings.

REFERENCES:
patent: 4436582 (1984-03-01), Saxena
patent: 4533935 (1985-08-01), Mochizuki
patent: 4707723 (1987-11-01), Okamoto et al.
patent: 4708904 (1987-11-01), Shmizu et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Multi-layer wirings on a semiconductor device and fabrication me does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Multi-layer wirings on a semiconductor device and fabrication me, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multi-layer wirings on a semiconductor device and fabrication me will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1044430

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.