Multi-layer pixellated gamma-ray detector

Radiant energy – Invisible radiant energy responsive electric signalling – Semiconductor system

Reexamination Certificate

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C250S370090

Reexamination Certificate

active

07439518

ABSTRACT:
A method and apparatus for detecting gamma-rays is provided, wherein the gamma-ray detector apparatus includes a plurality of detector elements arranged in a stacked configuration. Each of the plurality of detector elements may include, a detector wafer having at least one anode separated from a cathode via a wafer material, wherein the wafer material includes a wafer material thickness d, and a wafer interface, wherein the wafer interface is electrically connected to the at least one anode.

REFERENCES:
patent: 7166848 (2007-01-01), El-Hanany et al.
patent: 2007/0134906 (2007-06-01), Nygard
Shin Watanabe et al., “CdTe Stacked Detectors for Gamma-Ray Detection”, IEEE Transactions on Nuclear Science, IEEE Service Center, New York, NY, vol. 49, No. 3, Jun. 2002.
Nishizawa, H. et al., “Response Calculation of a Stacked CdZnTe Detector for 16N Gamma-Ray Measurement”, Nuclear Instruments & Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment; Elsevier, Amsterdam, NL, vol. 463, No. 1-2, May 1, 2001, pp. 268-274.

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