Optics: measuring and testing – Lamp beam direction or pattern
Patent
1992-12-11
1994-09-20
Evans, F. L.
Optics: measuring and testing
Lamp beam direction or pattern
2502019, G01J 100
Patent
active
053494326
ABSTRACT:
An improved method for imaging laser illuminated objects through a near field aberrator, and/or for measuring the phase distortions of the aberrator. The method utilizes a set of at least three laser beams that are offset with respect to each other in a lateral direction. This offset produces three similarly offset but otherwise identical complex fields in the wave fronts of the reflected return at the sensors. The individual laser beams are tagged with identifying characteristics that are apparent at the sensors, whereby the reflected return may be identified and classified according to origin in individual laser beams. The sensor signals are processed to measure distortions in the aberrator and to apply the measurements to obtain an enhanced image.
REFERENCES:
patent: 3731103 (1973-05-01), O'Meara
patent: 4750818 (1989-06-01), Cochran
Denson-Low W. K.
Evans F. L.
Gortler Hugh P.
Hughes Aircraft Company
Sales M. W.
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