Multi junction APS with dual simultaneous integration

Television – Camera – system and detail – Solid-state image sensor

Reexamination Certificate

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Details

C348S294000, C348S311000

Reexamination Certificate

active

06724426

ABSTRACT:

BACKGROUND
Active pixel sensors are described in U.S. pat. no. 5,417,215. Higher charge and efficiency from these devices is desirable. In addition, different parameters and operations can benefit from different kinds of samples. For example, a short sampling period can provide the highest amount of dynamic range, while a longer sampling period can provide better resolution. Fossum and Yadid-Pecht have described one such system and “Wide Intrascene Dynamic Range CMOS APS Using Dual Sampling, IEEE Transactions On Electronic Devices, volume 44 page 1721-1723, October 1997. In that system, two signals are obtained using two different integration intervals.
SUMMARY
The present application teaches a new pixel design with dual floating diffusion regions, each of which is separately controlled. The two regions collectively provide dual integration, but do so in a way that increases sensitivity, allows dual dynamic range, and also provides multiple junctions for improved photocarrier detection.


REFERENCES:
patent: 6310369 (2001-10-01), Narabu et al.
patent: 6388243 (2002-05-01), Berezin et al.
patent: 6486503 (2002-11-01), Fossum
patent: 6624850 (2003-09-01), Guidash

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