Multi-function probe card

Details Multi-function probe card Multi-function probe card

2006-01-10

2006-01-10

Hollington, Jermele M. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010

Reexamination Certificate

active

06984998

ABSTRACT:
A multi-function probe card (40) includes a PCB (41), a plurality of probe needles (47), a counter (71) to acquire a “piece sequence parameter”, a signal-measuring device (72) via the probe needles (71) to acquire a current, and a voltage parameters etc. as well as a parametric processing system (74). The parametric processing system (74) includes an I/O unit (51)/(59), a processing unit (52), a time providing unit (55), a real time display unit (56), and a storing unit (57). Moreover, the piece sequence parameter, current parameter, and voltage parameter can be input into the processing unit (52) through the I/O unit (51)/(59). Thereafter, a parametric data structure can be set up to record and calculate in accordance with the datum and parameters, and finally to display service processes and conditions of the probe card (40) through the real time display unit (56).

REFERENCES:
patent: 5070297 (1991-12-01), Kwon et al.
patent: 6072325 (2000-06-01), Sano
patent: 6075373 (2000-06-01), Iino
patent: 6570397 (2003-05-01), Mayder et al.
patent: 6590381 (2003-07-01), Iino et al.
patent: 6734691 (2004-05-01), Saijyo et al.
patent: 6900653 (2005-05-01), Yu et al.

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