Optics: measuring and testing – By light interference – Having polarization
Reexamination Certificate
2005-01-18
2005-01-18
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By light interference
Having polarization
Reexamination Certificate
active
06844935
ABSTRACT:
A multi-function opto-electronic detection apparatus for detecting molecular characteristics of a test sample. The appratuses comprises functional mode subsystems including a detecting light source subsystem for generating sampling beams for illuminating the test sample; a manipulation optics subsystem for aligning the sampling beam onto the test sample; a target signal processing subsystem for analyzing target beams emerging from the test sample resulting from the illuminating of the sampling beam; and a sample fixation subsystem for holding the test sample. The detecting light source subsystem, manipulation optics subsystem and target signal processing subsystem are assembled into one of several possible optical sampling setups for the detection characteristics of the test sample. The functional mode setups include at least ellispometer, confocal image scanner, photon tunneling scanning microscope and interferometer.
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Lee Chih-Kung
Lee Shu-Sheng
Lin Chii-Wann
Lin Shiming
Shiue Shuen-Chen
J. C. Patents
Lyons Michael A.
National Taiwan University
Toatley , Jr. Gregory J.
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