Multi-domain execution of tests on electronic devices

Details Multi-domain execution of tests on electronic devices Multi-domain execution of tests on electronic devices

2007-07-17

2007-07-17

Nghiem, Michael (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

Reexamination Certificate

active

11022148

ABSTRACT:
A device under test is divided into multiple test domains, and test conditions for each of the multiple test domains are defined separately, so that each test domain has its own test pattern, timing data, and other test conditions. Each test domain can start and stop independently, and run at different speeds. Further, triggers are used to specify how the tests executed in the different test domains interact and communicate with one another. Any test domain can generate or wait for a trigger from any other test domain (including the CPU).

REFERENCES:
patent: 6879927 (2005-04-01), Lu
patent: 7099792 (2006-08-01), Giral et al.
patent: 7107173 (2006-09-01), Fritzsche
patent: 7107574 (2006-09-01), Nedbal
patent: 7127641 (2006-10-01), Anderson
patent: 2003/0105607 (2003-06-01), Jones et al.
U.S. Appl. No. 11/520,202, Gilet, “Multi-Domain Execution of Tests on Electronic Devices”, Sep. 12, 2006.

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