Multi-dimensional sequential probability ratio test for...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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C702S179000

Reexamination Certificate

active

10918129

ABSTRACT:
One embodiment of the present invention provides a monitoring system that detects anomalies in data gathered from sensors in a computer system. During operation, the monitoring system samples data from a plurality of sensors located at various sampling points throughout the computer system. Next, the monitoring system interpolates the data from the sampling points to produce a real-time digitized surface. The monitoring system then subtracts a reference digitized surface from the real-time digitized surface to produce a residual digitized surface. Finally, the monitoring system applies a multi-dimensional sequential probability ratio test (SPRT) to the residual digitized surface to detect anomalies in the residual digitized surface which indicate an impending failure of the computer system.

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patent: 6839655 (2005-01-01), Gross et al.
patent: 2002/0091499 (2002-07-01), Wegerich et al.
patent: 2003/0220767 (2003-11-01), Wegerich

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