Multi-dimensional force sensing for scanning probe...

Details Multi-dimensional force sensing for scanning probe... Multi-dimensional force sensing for scanning probe...

2006-11-21

2006-11-21

Larkin, Daniel S. (Department: 2856)

Measuring and testing

Surface and cutting edge testing

Roughness

Reexamination Certificate

active

07137291

ABSTRACT:
A system and method of multi-dimensional force sensing for scanning probe microscopy is provided.

REFERENCES:
patent: 6346189 (2002-02-01), Dai et al.
patent: 5920 (1998-02-01), None
Wong, S.S. et al., “Carbon Nanotube Tips: High-Resolution Probes for Imaging Biological Systems” J. Am. Chem. Soc., vol. 120, 1998, pp. 603-604.
Cheung, C.L. et al., “Carbon Nanotube Atomic Force Microscopy Tips: Direct Growth by Chemical Vapor Deposition and Application to High-Resolution Imaging”, Proc. Natl. Acad. Sci., vol. 97, No. 8, Apr. 11, 2000, pp. 3809-3813.

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