Multi-diameter, hemisphere, center-of-hole locating probe

Geometrical instruments – Area integrators – Electrical

Patent

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Details

33172B, 33173, 33178B, G01B 322, G01B 512

Patent

active

042121060

ABSTRACT:
A multi-diameter centering probe having a spherical outer surface portion for insertion into a hole whose spacing from another hole is to measured. The member is formed of a one-piece construction for attachment to an automatic reversing dial test indicator when the measurement is to be taken from a relatively high friction measuring device, such as a vernier, dial, or electronic height gage. The probe can be attached directly to relatively low friction measuring devices, such as air-bearing height gages or measuring machines. A preferred embodiment of the member uses a number of integral, substantially hemispherical sections integral with each other and extending longitudinally of the central axis of the body so that the smallest section is at one end of the body and the largest section is at the opposite end of the body, the sections of intermediate diameter being between the two end sections.

REFERENCES:
patent: 1157389 (1915-10-01), Hess
patent: 1264519 (1918-04-01), Hinson
patent: 2437190 (1948-03-01), Gale
patent: 2911727 (1959-11-01), Steinhart
patent: 3864834 (1975-02-01), Horton
Carrico et al., "Caliper for Measuring Center-to-Center Distances of Holes", W. Elect. Tech. Dig. No. 14, 4-1969, p. 3.

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