Geometrical instruments – Gauge – Movable contact probe – per se
Patent
1996-03-08
1998-09-15
Will, Thomas B.
Geometrical instruments
Gauge
Movable contact probe, per se
33556, G01B 5012
Patent
active
058062017
ABSTRACT:
A multi-coordinate touch probe including a deflectable stylus, a stylus support, and a sensor arrangement for sensing the deflection of the stylus and for generating a deflection signal, with the deformation parameters of the assembly stylus/support, which include a geometrical layout of the support, a geometrical shape of the stylus, and properties of a stylus material, being so selected that a noticeable scanning direction-dependent characteristic is eliminated.
REFERENCES:
patent: 5090131 (1992-02-01), Deer
patent: 5111592 (1992-05-01), Aehnelt et al.
patent: 5657549 (1997-08-01), Shen et al.
Modjarrad, A.; and Hajdukiewicz, P, Development of a Small Novel 3-Dimensional High Accuracy Probe for CMMs, Quality Europe No.1, 26-30 (1991).
Weckenmann, Von A.; Goch, G.; and Springborn, H.D., Korrektur der Taststiftbiegung bei Messungen mit Mehrkoordinaten-Messgeraten, Feinwerktechnik & Messtechnik, 87, No. 1, 5-9 (1979).
Johannes Heidenhain GmbH
Will Thomas B.
LandOfFree
Multi-coordinate touch probe does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Multi-coordinate touch probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multi-coordinate touch probe will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-76449