Geometrical instruments – Gauge – Movable contact probe – per se
Patent
1994-07-26
1996-04-23
Will, Thomas B.
Geometrical instruments
Gauge
Movable contact probe, per se
33558, G01B 5012, G01B 5016
Patent
active
055092110
ABSTRACT:
A multi-coordinate probe includes at least one tracer pin for scanning an object and deflectable in a plurality of coordinate directions upon engagement with the object, and a plurality of sensors for detecting deflection of the tracer pin and having their respective measuring axes intersecting at the scanning pole, defined by the tracer pin.
REFERENCES:
patent: 4701704 (1987-10-01), Fukuyoshi et al.
patent: 4942671 (1990-07-01), Enderle et al.
patent: 4972597 (1990-11-01), Kadosaki et al.
patent: 5103572 (1992-04-01), Ricklefs
Johannes Heidenhain GmbH
Will Thomas B.
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