Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1994-01-27
1996-02-20
Gonzalez, Frank
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356363, 250237G, G01B 1100, G01B 1102
Patent
active
054933978
ABSTRACT:
A multi-coordinate measuring system having a diffraction element that receives light emitted by a light source and diffracts the light into at least a first, second, third and fourth partial beam bundles where the first, second, third and fourth partial beam bundles are directed in different coordinate directions onto a substrate. The substrate has first, second, third and fourth waveguides located thereon. The substrate has a coupling element that directs the first, second, third and fourth partial beam bundles into the first, second, third and fourth waveguides, respectively. The substrate also has a first coupling element for bringing the first and second partial beam bundles into interference and a second coupling element for bringing the third and fourth partial beam bundles into interference. A detector system then detects the interference of the first and second partial beam bundles and the third and fourth partial beam bundles.
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Aligauer Michael
Huber Walter
Dr. Johannes Heidenhain GmbH
Eisenberg Jason D.
Gonzalez Frank
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