Multi-comparator A/D converter with circuit for testing the oper

Details Multi-comparator A/D converter with circuit for testing the oper Multi-comparator A/D converter with circuit for testing the oper

1990-09-17

1992-06-23

Williams, Howard L.

Coded data generation or conversion

Converter calibration or testing

341159, H03M 0000

Patent

active

051247046

ABSTRACT:
Apparatus and procedure for testing a flash analog-to-digital converter on a chip including a first NOR gate having a plurality of inputs, one each connected to each normal output of the comparators and a second NOR gate having a plurality of inputs, one each connected to each inverted output of the comparators. The output currents of the NOR gates are monitored to determine the states of the comparators when various input voltages are supplied. All comparators are tested for operation.

REFERENCES:
patent: 4600916 (1986-07-01), Masuda et al.

Affiliated with

Also associated with

Rating

Multi-comparator A/D converter with circuit for testing the oper does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Multi-comparator A/D converter with circuit for testing the oper, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multi-comparator A/D converter with circuit for testing the oper will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-936014