Multi-chip module with accessible test pads and test fixture

Details Multi-chip module with accessible test pads and test fixture Multi-chip module with accessible test pads and test fixture

1998-03-05

2000-07-25

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324755, G01R 3100

Patent

active

060940565

ABSTRACT:
A test fixture for use with an improved multi-chip-module wherein the multi-chip-module has a plurality of chips on the top surface, the module having at least one net associated with the chips completely embedded within the substrate and wherein at least one pad is attached to the bottom surface of the substrate and a conductive path provided between the pad and the net. The test fixture includes a zero-insertion-force socket having at least one socket pin having a surface for conductively contacting the pad on the multi-chip-module and extending through the socket and a circuit board having a plurality of inlets for conductively receiving the socket pins including the socket pin contacting the pad.

REFERENCES:
patent: 4489364 (1984-12-01), Chance et al.
patent: 4812742 (1989-03-01), Abel et al.
patent: 4922377 (1990-05-01), Matsumoto elt al.
patent: 5243140 (1993-09-01), Bhatia et al.
patent: 5243498 (1993-09-01), Scofield
patent: 5262719 (1993-11-01), Magdo
patent: 5354955 (1994-10-01), Gregor et al.
patent: 5389885 (1995-02-01), Swart
patent: 5477160 (1995-12-01), Love
patent: 5519331 (1996-05-01), Cowart et al.
IBM Technical Disclosure Bulletin, "AC Chip In-Place Test", M. T. McMahon, Jr., vol. 17, No. 6, pp. 1607-1608., Nov. 1974.

Affiliated with

Also associated with

Rating

Multi-chip module with accessible test pads and test fixture does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Multi-chip module with accessible test pads and test fixture, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multi-chip module with accessible test pads and test fixture will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1339037