Multi-channel test system using optical waveguide modulators

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371 15, 350356, G02B 514, G06F 1122

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active

045049211

ABSTRACT:
A test system utilizing modulators responsive to signals to be tested positioned between a source of electromagnetic radiation and a sensor with the signal to be tested coupled to the input of the modulators. Preferably the modulators are positioned in optical wave guides with the modulators being electric-field operated devices to prevent any significant loading of the signals to be tested. Disclosed embodiments utilize light as the electromagnetic energy with lithium niobate substrates having titanium diffused therein forming the optical wave guides. Modulators are provided by planar electrodes affixed to the surface of the lithium niobate substrate to change the electric field across the optical waveguide. Coupling is conveniently provided to the wave guides through fiber optic bundles.

REFERENCES:
patent: 3994566 (1976-11-01), Lotspeich et al.
patent: 4166669 (1979-09-01), Leonberger et al.
patent: 4271516 (1981-06-01), Smith
patent: 4281904 (1981-08-01), Sprague et al.
Herrman et al. "Diagnostic Test Circuit for Isolated Digital Inputs", IBM Technical Disclosure Bulletin, vol. 21, No. 1, Jun., 1978, pp. 3-4.

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