Optics: measuring and testing – Document pattern analysis or verification
Patent
1975-10-10
1977-03-15
McGraw, Vincent P.
Optics: measuring and testing
Document pattern analysis or verification
250559, 250571, 356203, G06K 908
Patent
active
040121437
ABSTRACT:
A multi-axis scanning technique and system for achieving same are provided or digitizing micro-documentation with a pulsed laser beam scanner. Micro-documentation such as a 35mm aperture card reduction of an E-size engineering drawing is incrementally advanced into the path of the scanner and each incremental area is scanned in a predetermined sequence of discrete areas. These discrete areas provide data which is subject to vector and area compaction techniques.
REFERENCES:
patent: 3768913 (1973-10-01), Klimecki
patent: 3818190 (1974-06-01), Silverman et al.
Edelberg Nathan
Elbaum Saul
Gibson Robert P.
McGraw Vincent P.
The United States of America as represented by the Secretary of
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