Semiconductor device manufacturing: process – Having magnetic or ferroelectric component
Reexamination Certificate
2005-12-20
2005-12-20
Dang, Phuc T. (Department: 2818)
Semiconductor device manufacturing: process
Having magnetic or ferroelectric component
C438S096000, C438S653000, C365S158000
Reexamination Certificate
active
06977181
ABSTRACT:
A method of forming a magnetic stack and a structure for a magnetic stack of a resistive memory device. A crystallization inhibiting layer is formed over the free layer of a magnetic stack, improving thermal stability. The crystallization inhibiting layer comprises an amorphous material having a higher crystallization temperature than the crystallization temperature of the free layer material. The crystallization inhibiting layer inhibits the crystallization of the underlying free layer, providing improved thermal stability for the resistive memory device.
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Dang Phuc T.
Infincon Technologies AG
Slater & Matsil L.L.P.
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