Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-05-24
2009-10-06
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07598758
ABSTRACT:
Described are methods of using probes, for making electrical contact to high-density chips or similar electronic devices. Two groups of probes are covered. The first group includes probes that are moved laterally, parallel to the surface of the contact pads of the device under test, after the initial contact has been made. This is to create the desired wipe or scrub. The second group includes probes that operate on the principle of suction cups. When the probe is pushed against the device under test, the probe working tips stretch outwardly and create the desirable wipe or scrub. Described also are the probes themselves that are used for the above methods. In this divisional application, the emphasis is on the first group.
REFERENCES:
patent: 4918383 (1990-04-01), Huff et al.
patent: 5914613 (1999-06-01), Gleason et al.
patent: 6507207 (2003-01-01), Nguyen
Nguyen Ha Tran T
Nguyen Tung X
LandOfFree
MP3 micro probe does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with MP3 micro probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and MP3 micro probe will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4119595