Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1994-06-13
1995-10-10
Turner, Samuel A.
Optics: measuring and testing
By particle light scattering
With photocell detection
356346, 356244, G01B 902
Patent
active
054575311
ABSTRACT:
A scanning interferometer includes an optical arrangement. The optical arrangement therein includes two mirrors diverting the travel direction of light, arranged back-to-back such that they reflect to opposite directions and that their optical axes join. The mirrors are arranged in a mounting, which is arranged to move back and forth by a moving mechanism. The mounting includes a base element supported by the body of the interferometer, at least two support arms connected with the base element at their first ends via first bending points and a mounting element connected with the second ends of the support arms via second bending points, the mirrors being fastened to the mounting element. The mechanism moving the mounting includes a assembly generating a linear back-and-forth movement and a transmission mechanism for converting the back-and-forth movement to a back-and-forth movement of the mounting element.
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Eisenberg Jason D.
Temet Instruments Oy
Turner Samuel A.
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