Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Threaded fastener stress
Reexamination Certificate
2008-01-29
2008-01-29
Lefkowitz, Edward (Department: 2855)
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Threaded fastener stress
C073S493000, C073S866500, C248S610000, C248S612000, C248S613000, C248S904000
Reexamination Certificate
active
07322249
ABSTRACT:
A robust, easy to mount probe sensor includes an elongated body enclosing a sensor element and an integral flange extending away from the body. The body and flange are formed of material having a relatively low characteristic yield point. First and second generally parallel closely spaced through passages extend through the flange. An insert formed of material having a relatively high characteristic yield point is disposed in one of the passages. A fastener including a shank portion which extends through the other passageway includes an enlarged head which overlays the insert containing passageway and engages an attachment structure to effect directed compressive loading of the probe sensor flange.
REFERENCES:
patent: 4779434 (1988-10-01), Derman
patent: 4788870 (1988-12-01), Gath et al.
patent: 5295405 (1994-03-01), Gumbert et al.
patent: 5705930 (1998-01-01), Forfitt
patent: 5922953 (1999-07-01), Payne et al.
patent: 5951191 (1999-09-01), Schroeder et al.
patent: 5996408 (1999-12-01), TenBrink et al.
patent: 6062529 (2000-05-01), Stevenson et al.
patent: 6070865 (2000-06-01), Schroeder et al.
patent: 6123301 (2000-09-01), Schroeder et al.
patent: 6176636 (2001-01-01), Stevenson et al.
patent: 6272747 (2001-08-01), Schroeder et al.
patent: 6453732 (2002-09-01), Schroeder et al.
patent: 6539800 (2003-04-01), Yamashita
patent: 6579030 (2003-06-01), Uhler et al.
patent: 6736355 (2004-05-01), Palfenier et al.
patent: 6774623 (2004-08-01), Palfenier et al.
patent: 6788054 (2004-09-01), Collins et al.
patent: 6851306 (2005-02-01), Shost et al.
patent: 2002/0007675 (2002-01-01), Yamashita
patent: 2003/0230689 (2003-12-01), Palfenier et al.
patent: 2004/0069914 (2004-04-01), Palfenier et al.
Barrera Leonel A.
Paddock Stephen G
Delphi Technologies Inc.
Kirkland, III Freddie
Lefkowitz Edward
Marshall Paul L.
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