Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Reexamination Certificate
2007-10-23
2007-10-23
Ngô, Ngân V. (Department: 2818)
Semiconductor device manufacturing: process
With measuring or testing
Packaging or treatment of packaged semiconductor
C438S121000, C438S122000, C257SE21499
Reexamination Certificate
active
10930350
ABSTRACT:
In a package mounting structure for mounting a package on a case, wherein the package internally incorporates at least one of a high-frequency transistor, MIC and MMIC used in the microwave to millimeter-wave band, and a base thereof is formed of metal and serves as ground, an electrically conductive sheet having excellent thermal conductivity and exhibiting restorability and having a size identical with that of the base of the package is laid on the case at a package-bearing location, the package and sheet are fastened together by two or more screws, and the sheet is mounted on the case while it is pressed by a pressing force of 10 N/cm2or greater owing to fastening.
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Nakazawa Isao
Shigaki Masafumi
Yamanaka Kazunori
Fujitsu Limited
Katten Muchin & Rosenman LLP
Ngo Ngan V.
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