Mounting arrangement for a probe tip of a scanning force or tunn

Details Mounting arrangement for a probe tip of a scanning force or tunn Mounting arrangement for a probe tip of a scanning force or tunn

1996-05-02

1997-12-23

Ngo, John

Optical waveguides

Accessories

Plug/termination device

385 78, 385147, C02B 636

Patent

active

057013810

ABSTRACT:
In a support arrangement for a probe tip of a scanning force microscope or a SNOM wherein the movement of the probe tip while scanning a sample surface is interferometrically determined and wherein a ferrule mounted on a ferrule holder includes an optical light conductor with an end projecting from the ferrule and having an end face, the probe tip is supported by a mounting means which can be slipped onto the ferrule into a predetermined position in which the probe tip is disposed in front of the light conductor end face with a given gap therebetween.

REFERENCES:
patent: 5138159 (1992-08-01), Takase et al.
patent: 5559330 (1996-09-01), Murashita
Review of Scientific Instruments vol. 62 No. 5, May 91, New York pp. 1280-1284 P.J. Mulhern et al. "A Scaning Force Microscope with a fiber-optic inf. displ. sensor".
IBM Techn. Disch. Bulletin vol. 31, No. 9, Feb. 89 New York p. 216 "Tip Rev. Tunnel. Mic.".
Measurement and Science Technology vol. 4, No. 7, Jul. 93, Bristol GB pp. 769-775, A. Moser et al, "A miniature fibre optic force microscope scan head".

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