Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2009-02-27
2010-10-19
Punnoose, Roy (Department: 2886)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
Reexamination Certificate
active
07817263
ABSTRACT:
A mounting apparatus includes a coating unit, an acquiring portion, a judging portion, and a mounting mechanism. The coating unit coats a first region of a coating target component as a coating target region with a coating agent. The acquiring portion acquires first luminance information of the first region before being coated by the coating unit and second luminance information of the first region after being coated by the coating unit. The judging portion judges a quality of a coating state of the coating agent in the first region by comparing the first luminance information and the second luminance information. The mounting mechanism mounts, on a mounting target object, the coating target component judged by the judging portion that the coating state in the first region is favorable.
REFERENCES:
patent: 2002/0009536 (2002-01-01), Iguchi et al.
patent: 2007/0229810 (2007-10-01), Kaya
patent: 2005-019380 (2005-01-01), None
patent: 2008-216140 (2008-09-01), None
Ibayashi Yoshihiro
Kawazu Yukio
Punnoose Roy
Rader & Fishman & Grauer, PLLC
Sony Corporation
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