1978-12-29
1981-06-16
Larkins, William D.
357 64, H01L 2978, H01L 29167
Patent
active
042741050
ABSTRACT:
The sensitivity of the threshold voltage in MOSFET devices to changes in substrate voltage may be reduced at a given temperature by the introduction of sufficiently deep energy level, low diffusivity impurities into the depletion region under the gate of the MOSFET.
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Brotherton et al., Proc. Conf. on Integrated Circuits, East England, May 1967 (IEEE Conf. Pub. #30).
Proc. IEEE, Richman, pp. 774-775, (Apr. 1968).
Crowder Billy L.
Gaensslen Fritz H.
Jaeger Richard C.
International Business Machines - Corporation
Larkins William D.
Riddles Alvin J.
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