MOS transistor with self-aligned source and drain, and...

Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE29289

Reexamination Certificate

active

07619248

ABSTRACT:
A MOS transistor with self-aligned source/drain terminals, and methods for its manufacture. The transistor generally includes an electrically functional substrate, a dielectric film on portions of the substrate, a gate on the dielectric film, and polycrystalline source and drain terminals self-aligned with the gate. The method generally includes forming an amorphous semiconductor material on a gate and on exposed portions of an electrically functional substrate, irradiating an upper surface of the amorphous semiconductor material to form self-aligned polycrystalline semiconducting source/drain terminal layers, and (optionally) selectively removing the non-irradiated amorphous semiconductor material portions. The present invention advantageously provides MOS thin film transistors having reliable electrical characteristics quickly, efficiently, and/or at a low cost by eliminating one or more conventional photolithographic steps.

REFERENCES:
patent: 5612235 (1997-03-01), Wu et al.
patent: 5658808 (1997-08-01), Lin
patent: 5821137 (1998-10-01), Wakai et al.
patent: 5989944 (1999-11-01), Yoon
patent: 6245602 (2001-06-01), Ho et al.
patent: 6274412 (2001-08-01), Kydd et al.
patent: 6278131 (2001-08-01), Yamazaki et al.
patent: 6294401 (2001-09-01), Jacobson et al.
patent: 6316357 (2001-11-01), Lin et al.
patent: 6323069 (2001-11-01), Yamazaki et al.
patent: 6348295 (2002-02-01), Griffith et al.
patent: 6379745 (2002-04-01), Kydd et al.
patent: 6511870 (2003-01-01), Chen et al.
patent: 6518087 (2003-02-01), Furusawa et al.
patent: 6593591 (2003-07-01), Yudasaka et al.
patent: 6660598 (2003-12-01), Hanafi et al.
patent: 6664027 (2003-12-01), Griffith et al.
patent: 6767775 (2004-07-01), Yudasaka et al.
patent: 6864133 (2005-03-01), Aoki et al.
patent: 2002/0053671 (2002-05-01), Koyama
patent: 2003/0042559 (2003-03-01), Takemura et al.
patent: 2004/0053431 (2004-03-01), Chang et al.
patent: 2004/0248429 (2004-12-01), Aoki et al.
patent: 2005/0176183 (2005-08-01), Aoki et al.
patent: 2005/0181566 (2005-08-01), Machida et al.
Zhibin Xiong et al.; A Novel Self-Aligned Offset-Gated Polysilicon TFT Using High-K Dielectric Spacers; IEEE Electron Device Letters, vol. 25, No. 4, Apr. 2004; pp. 194-195.
J. H. Lee et al.; The Improvement of Reliability in the Poly-Si TFTs Employing Laser Irradiation on Gate Oxide; AM-LCD '03, pp. 169 et seq. (TFTp3-3).
Hongmei Wang et al.; High Frequency Performance of Large-Grain Polysilicon-on-Insulator MOSFETs; IEEE Transactions on Electron Devices, vol. 48, No. 7, Jul. 2001; pp. 1480-2.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

MOS transistor with self-aligned source and drain, and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with MOS transistor with self-aligned source and drain, and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and MOS transistor with self-aligned source and drain, and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4099480

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.