Coded data generation or conversion – Analog to or from digital conversion – With particular solid state devices
Patent
1990-01-30
1991-03-19
Pellinen, A. D.
Coded data generation or conversion
Analog to or from digital conversion
With particular solid state devices
341118, 323316, 340767, 358236, 3072968, H03M 106
Patent
active
050014811
ABSTRACT:
A circuit that compensates for threshold voltage variations in a large array of deposited thin film MOS transistors includes a threshold voltage compensation transistor for a subset of the deposited analog thin film transistors having a prescribed source to gate threshold voltage. The source electrode of the threshold voltage compensation transistor receives a voltage corresponding to the maximum threshold voltage in the large array. The gate and drain electrodes of the threshold voltage compensation transistor are connected together and to one terminal of a capacitor. The other terminal of the capacitor is connected to a second voltage and the capacitor is momentarily discharged to set the threshold voltage compensation transistor gate and drain electrodes to the second voltage. The gate and drain electrodes of the threshold voltage compensation transistor are connected to the gate electrodes of the subset of analog thin film transistors. As a result, the source to gate voltages of the analog transistors over the large array are independent of their threshold values.
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Burke W. J.
David Sarnoff Research Center Inc.
Pellinen A. D.
Williams H. L.
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