Optics: measuring and testing – By light interference – Rotation rate
Reexamination Certificate
2005-08-30
2005-08-30
Turner, Samuel A. (Department: 2877)
Optics: measuring and testing
By light interference
Rotation rate
Reexamination Certificate
active
06937342
ABSTRACT:
A monolithically integrated semiconductor laser rotation sensor/gyroscope that includes at least two isolated, nonsynchronized semiconductor lasers; at least one being unidirectional and at least a further one being either a straight-line laser or a second unidirectional ring laser configured to propagate lasing light waves in the direction opposite to the first unidirectional ring laser; semiconductor directional waveguide couplers; a semiconductor Y-junction mixing region; and a semiconductor photodetector. Evanescently outcoupled signals are routed to a photodetector for detection of the Sagnac shifted frequencies to discern a beat frequency resulting from rotation of the chip structure. The straight-line semiconductor laser serves as frequency reference insensitive to rotation. Directing, filtering, and radiating unwanted reflections or backscattered light to highly absorbing regions is carried out with waveguide coupler designs and nonreciprocal couplers and filters.
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Eliseev Petr G.
Osinski Marek A.
Taylor Edward W.
Schwegman Lundberg Woessner & Kluth P.A.
Science & Technology Corporation @ University of New Mexico
Turner Samuel A.
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