Monolithically integratable circuit for measuring longitudinal a

Details Monolithically integratable circuit for measuring longitudinal a Monolithically integratable circuit for measuring longitudinal a

1986-03-20

1988-11-01

Ng, Jin F.

Telephonic communications

Diagnostic testing, malfunction indication, or electrical...

Testing of subscriber loop or terminal

379399, 379413, 323315, G05F 316, H04M 1900

Patent

active

047825073

ABSTRACT:
A circuit, which may be monolithically integrated, for measuring longitudinal and transverse currents in a two-wire transmission line, includes first and second current mirror circuits of a first type, each having an input branch and first and second output branches. The measuring circuit also includes third, fourth and fifth current mirror circuits, each having an input branch and an output branch, and first and second currents mirror circuits of a second type, each having first and second input branches and first and second output branches. The input branches of the first and second current mirror circuits of the first type and the first input branches of the first and second current mirror circuits of the second type are used as input terminals for coupling to the line. The first and second current mirror circuits of the first type are both connected to the third current mirror circuit and are respectively connected to the first and second current mirror circuits of the second type, which are both connected to the fourth current mirror circuit. The second current mirror circuit of the second type is connected to the fifth current mirror circuit whose output the first output of the first current mirror circuit of the second type are connected together to form a first output terminal. The output of the third and the fourth current mirror circuits are connected together to form a second output terminal.

REFERENCES:
patent: 3290671 (1966-12-01), Lamoureux
patent: 4203012 (1980-05-01), Boxall
patent: 4300023 (1981-11-01), Kelley et al.
patent: 4314196 (1982-02-01), Brown
patent: 4408190 (1983-10-01), Nagano
patent: 4414434 (1983-11-01), Ferrieu et al.
patent: 4431874 (1984-02-01), Zobel et al.

Affiliated with

Also associated with

Rating

Monolithically integratable circuit for measuring longitudinal a does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Monolithically integratable circuit for measuring longitudinal a, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Monolithically integratable circuit for measuring longitudinal a will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-895124