Miscellaneous active electrical nonlinear devices – circuits – and – External effect – Temperature
Reexamination Certificate
2011-04-05
2011-04-05
Zweizig, Jeffrey S (Department: 2816)
Miscellaneous active electrical nonlinear devices, circuits, and
External effect
Temperature
Reexamination Certificate
active
07920016
ABSTRACT:
A testing procedure may determine whether a monolithic voltage reference device meets a temperature drift specification. A first non-room temperature output voltage of the monolithic voltage reference device may be measured while the monolithic voltage reference device is at a first non-room temperature which is substantially different than room temperature. First non-room temperature information may be stored in a memory within the monolithic voltage reference device which is a function of the first non-room temperature output voltage. A second non-room temperature output voltage of the monolithic voltage reference device may be measured while the monolithic voltage reference device is at a second non-room temperature which is substantially different than the room temperature and the first non-room temperature. Second non-room temperature information may be stored in the memory without destroying the first non-room temperature information which is a function of the second non-room temperature output voltage. A determination may be made whether the monolithic voltage reference device meets the temperature drift specification based on a computation that is a function of both the first non-room temperature information and the second non-room temperature information.
REFERENCES:
patent: 5053640 (1991-10-01), Yum
patent: 5319370 (1994-06-01), Signore et al.
patent: 5440305 (1995-08-01), Signore et al.
patent: 07333909 (1996-09-01), None
patent: 01123171 (1989-05-01), None
U.S. Appl. No. 12/475,184, “Monolithic Voltage Reference Device with Internal, Multi-Temperature Drift Data and Related Testing Procedures,” Figure 1, Applicants' Admitted Prior Art, filed May 29, 2009.
Megaw, D. 2008. Voltage Reference Selection Basics. In Power Designer, published by National Semiconductor, Aug. 2008, pp. 1-11.
PCT Application No. PCT/US2010/036885 (corresponding to U.S. Appl. No. 12/475,184), International Search Report and Written Opinion of the International Searching Authority, mailed Sep. 14, 2010 by the European Patent Office as International Searching Authority.
Anderson Michael B.
Hasoon Tahir M.
Reay Robert L.
Whelan Brendan J.
Wright J. Spencer
Linear Technology Corporation
McDermott Will & Emery LLP
Zweizig Jeffrey S
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