Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen
Patent
1993-02-26
1994-04-12
Swann, Tod R.
Thermal measuring and testing
Temperature measurement
In spaced noncontact relationship to specimen
374178, 324 95, 324106, G01J 518
Patent
active
053020243
ABSTRACT:
A monolithic integrated circuit power sensor provides a monolithic integrated circuit substrate, a conversion element formed either on or in the substrate for converting microwave energy into heat, and a thermally sensitive diode junction formed in sufficiently close proximity to the conversion element to be thermally coupled thereto.
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DC to 40 GHz MMIC Power Sensor, Oct. 7, 1990, 1990 IEEE GaAs IC Symposium.
Gomes David W.
Lockheed Sanders, Inc.
Swann Tod R.
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