Monolithic microwave integrated circuit with probing pads

Details Monolithic microwave integrated circuit with probing pads Monolithic microwave integrated circuit with probing pads

1987-11-06

1989-01-31

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

324158R, 324158T, G01R 3102, G01R 3128

Patent

active

048018678

ABSTRACT:
In monolithic microwave integrated circuits of resistance-capacitance construction, selection after production can be easily performed without sacrificing high frequency characteristics by adding thereto composing pads such as pads for signal, pads for power source, pads for bias and the like and pads for measuring direct current characteristics and selecting chips. Further, said monolithic microwave integrated circuits added with pads for measuring and selecting direct current characteristics can be easily selected by probing them on wafers.

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patent: 4677474 (1987-06-01), Sato et al.
Archer et al.; "A GaAs Monolithic . . . "; IEEE Journal of Solid-State Circuits; vol. SC. 16; No. 6; Dec. 1981; pp. 648-652.
Honjo et al.; "Ultra-Broad-Band . . . "; IEEE Trans. on Microwave Theory and Techniques; vol. MTT-30; No. 7; Jul. 1982; pp. 1027-1033.
Nishiuma et al.; "A 2.2 db NF . . . "; 1983 IEEE International Solid-State Circuits Conference; Digest of Technical Papers; Feb. 24, 1983; pp. 194-195.

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