Scanning-probe techniques or apparatus; applications of scanning – General aspects of spm probes – their manufacture – or their... – Probe characteristics
Reexamination Certificate
2006-03-23
2009-08-11
Vanore, David A. (Department: 2881)
Scanning-probe techniques or apparatus; applications of scanning
General aspects of spm probes, their manufacture, or their...
Probe characteristics
C073S105000, C423S447100, C216S002000
Reexamination Certificate
active
07572300
ABSTRACT:
A scanning probe where the micromachined pyramid tip is extended by the growth of an epitaxial nanowire from the top portion of the tip is disclosed. A metallic particle, such as gold, may terminate the nanowire to realize an apertureless near-field optical microscope probe.
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Cohen Guy M.
Hamann Hendrik F.
Alexanian Vazken
International Business Machines - Corporation
Johnston Phillip A.
Scully , Scott, Murphy & Presser, P.C.
Vanore David A.
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